Scanning electron microscopy (SEM) is used for element mapping and visualization

SEM-EDS - Scanning Electron Microscope

Scanning electron microscopy (SEM) services is used for element mapping and visualization, surface finish, contaminations, failure and fracture investigation in all kind of solid materials.

Our laboratory has the insight to make microscopy investigation to provide documentation of materials and products.  The SEM (Scanning-Electron-Microscope) is a special useful instrument when it comes to investigate and provide documentation of materials and products.

SEM-EDS testing areas 

  • Consultations and problem solving
  • Product and material imperfections
  • Weakness in product design
  • Material and surface structures
  • Flow patterns build in stresses in plastic parts
  • Crystal structures
  • Powder morphology
  • Element analysis
  • Phase distribution of inhomogeneous materials  

Together with our knowledge and experience Norner can offer a full-range analysis of organic and in-organic materials. We support all levels within research and development, operation and failure analysis.  We can offer a broad and high-quality service within this field.

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Read more about other testing service areas.

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